复消色差光学设计
可选长工作距离
微分辨力
High Numerical Aperture (NA) up to 1.45
Chromatic Aberration Correction from 400 - 1000nm
Uniform Image Flatness over Large FOVs
这些物镜采用高标准、质量好的无应力光学系统，提供了一个较长的工作距离和大的数值孔径。分辨力可从5微米到0.34微米,目前这种镜头正在被大规模的使用。所有形式的放大倍率都集成在一个焦距为200mm的管上，接口螺纹为M26 x 36 TPI，可以选配所有的Mitutoyo品牌的配件。
型号: | UPLXAPO4X | UPLXAPO10X | UPLXAPO20X | UPLXAPO40X | UPLXAPO60XO | UPLXAPO100XO |
放大率: | 4X | 10X | 20X | 40X | 60X | 100X |
数字孔径NA: | 0.16 | 0.4 | 0.8 | 0.95 | 1.42 | 1.45 |
工作距离(mm): | 13 | 3.1 | 0.61 | 0.18 | 0.15 | 0.135 |
盖玻片厚度(mm): | 0 | 0.17 | 0.17 | 0.11 - 0.23 | 0.17 | 0.17 |
Field Number (mm): | 26.5 | 26.5 | 26.5 | 26.5 | 26.5 | 26.5 |
焦距FL (mm): | 45 | 18 | 9 | 4.5 | 3 | 1.8 |
安装螺纹: | RMS | RMS | RMS | RMS | RMS | RMS |
Parfocal Length (mm): | 45.06 | 45.06 | 45.06 | 45.06 | 45.06 | 45.06 |
Immersion Liquid: | N/A | N/A | N/A | N/A | Oil | Oil |
注意 : | 注意 : | 注意 : | 注意 : | |||
Spring-loaded | Spring-loaded and equipped with Correction Collar | Spring-loaded. Recommended Immersion Oil | Spring-loaded. Recommended Immersion Oil |
Olympus X-Line Extended Apochromat Objectives (also referred to as the UPLXAPO series) are Olympus’ next generation high performance objectives that simultaneously feature high numerical aperture (NA), broadband chromatic aberration correction, and excellent image flatness. The high numerical aperture (NA) allows for excellent light collection efficiency to better capture faint signals, enabling a shorter exposure time and higher contrast. The broad chromatic aberration correction compensates for the wavelength-dependent spatial shift of colors to achieve excellent color reproduction. These objectives also achieve high image flatness from the center to the edges of images over large fields of view (FOV), making them ideal for image stitching and quantitative image analysis. Olympus X-Line Extended Apochromat Objectives are used in demanding life science and clinical applications including pathology, fluorescence microscopy, multicolor or widefield fluorescence imaging, confocal or super resolution microscopy, and whole slide imaging.
